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Groups > linux.kernel > #1314011
| From | Boris Brezillon <boris.brezillon@free-electrons.com> |
|---|---|
| Newsgroups | linux.kernel |
| Subject | Re: [RFC] spi-nor: fix cross die reads on Micron multi-die devices |
| Date | 2016-01-21 10:00 +0100 |
| Message-ID | <qTjfY-2QP-5@gated-at.bofh.it> (permalink) |
| References | <qSR0m-8sS-11@gated-at.bofh.it> <qSZKj-68m-21@gated-at.bofh.it> <qTbV7-6bq-11@gated-at.bofh.it> |
| Organization | linux.* mail to news gateway |
Hi Bean, On Thu, 21 Jan 2016 01:06:48 +0000 Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> wrote: > Hi, Adam and Boris > > For Micron MT25Q ,MT25T and MT35Q, they does not exist this action even they are > Multi-die devices. So when the last byte of the die selected is read, the next byte output > is the first byte of next die(not the same die). > You can check this by extended address register chapter in our datasheet, there are detail > Information. I never said you were wrong ;), I just asked if it was relevant to differentiate the two cases. IOW, would the implementation proposed by Adam work correctly on all chips? And what is the real performance penalty for MT25Q ,MT25T and MT35Q if we decide to split the read command in several reads to handle this cross die case? Best Regards, Boris -- Boris Brezillon, Free Electrons Embedded Linux and Kernel engineering http://free-electrons.com
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RE: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> - 2016-01-20 03:50 +0100
Re: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Adam Somerville <adamsomerville@gmail.com> - 2016-01-20 13:10 +0100
Re: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Boris Brezillon <boris.brezillon@free-electrons.com> - 2016-01-20 13:30 +0100
RE: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> - 2016-01-21 02:10 +0100
Re: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Boris Brezillon <boris.brezillon@free-electrons.com> - 2016-01-21 10:00 +0100
RE: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> - 2016-01-22 08:10 +0100
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