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Groups > linux.kernel > #1314785
| From | Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> |
|---|---|
| Newsgroups | linux.kernel |
| Subject | RE: [RFC] spi-nor: fix cross die reads on Micron multi-die devices |
| Date | 2016-01-22 08:10 +0100 |
| Message-ID | <qTE13-BU-1@gated-at.bofh.it> (permalink) |
| References | <qSR0m-8sS-11@gated-at.bofh.it> <qSZKj-68m-21@gated-at.bofh.it> <qTbV7-6bq-11@gated-at.bofh.it> <qTjfY-2QP-5@gated-at.bofh.it> |
| Organization | linux.* mail to news gateway |
> Hi Bean, > > On Thu, 21 Jan 2016 01:06:48 +0000 > Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> wrote: > > > Hi, Adam and Boris > > > > For Micron MT25Q ,MT25T and MT35Q, they does not exist this action > > even they are Multi-die devices. So when the last byte of the die > > selected is read, the next byte output is the first byte of next die(not the > same die). > > You can check this by extended address register chapter in our > > datasheet, there are detail Information. > > I never said you were wrong ;), I just asked if it was relevant to differentiate > the two cases. IOW, would the implementation proposed by Adam work > correctly on all chips? And what is the real performance penalty for > MT25Q ,MT25T and MT35Q if we decide to split the read command in several > reads to handle this cross die case? For this , performance penalty is tiny, can ignore. SPI NOR read performance only depends on SPI I/O clock. Not the same as NAND. > Best Regards, > > Boris > > -- > Boris Brezillon, Free Electrons > Embedded Linux and Kernel engineering > http://free-electrons.com
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RE: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> - 2016-01-20 03:50 +0100
Re: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Adam Somerville <adamsomerville@gmail.com> - 2016-01-20 13:10 +0100
Re: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Boris Brezillon <boris.brezillon@free-electrons.com> - 2016-01-20 13:30 +0100
RE: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> - 2016-01-21 02:10 +0100
Re: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Boris Brezillon <boris.brezillon@free-electrons.com> - 2016-01-21 10:00 +0100
RE: [RFC] spi-nor: fix cross die reads on Micron multi-die devices Bean Huo 霍斌斌 (beanhuo) <beanhuo@micron.com> - 2016-01-22 08:10 +0100
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